In-Doped Gallium Oxide Micro- and Nanostructures: Morphology, Structure, and Luminescence Properties
Author(s) -
Iñaki López,
A. D. Utrilla,
Emilio Nogales,
Bianchi Méndez,
J. Piqueras,
Andrea Peche,
Julio RamírezCastellanos,
J.M. González-Calbet
Publication year - 2012
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/jp210233p
Subject(s) - cathodoluminescence , indium , gallium , materials science , luminescence , raman spectroscopy , x ray photoelectron spectroscopy , scanning electron microscope , oxide , transmission electron microscopy , microstructure , doping , nanotechnology , chemical engineering , analytical chemistry (journal) , optoelectronics , chemistry , optics , metallurgy , composite material , physics , chromatography , engineering
The influence of indium doping on morphology, structural, and luminescence properties of gallium oxide micro- and nanostructures is reported. Indium-doped gallium oxide micro- and nanostructures have been grown by thermal oxidation of metallic gallium in the presence of indium oxide. The dominant morphologies are beltlike structures, which in many cases are twisted leading to springlike structures, showing that In diffusion in Ga2O3 influences the microstructure shapes. High-resolution transmission electron microscopy has revealed the presence of twins in the belts, and energy-dispersive X-ray spectroscopy in the scanning electron microscopy (SEM) has detected a segregation of indium impurities at the edges of planar structures. These results suggest that indium plays a major role in the observed morphologies and support the assumption of a layer by layer model as growth mechanism. An additional assessment of indium influence on the defect structure has been performed by cathodoluminescence in the SEM, X-ray photoelectron microscopy, and spatially resolved Raman spectroscopy
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