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Dielectric Signature of a Dead Layer in Ultrathin Films of a Nonpolar Polymer
Author(s) -
Simone Napolitano,
Michael Wübbenhorst
Publication year - 2007
Publication title -
the journal of physical chemistry b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.864
H-Index - 392
eISSN - 1520-6106
pISSN - 1520-5207
DOI - 10.1021/jp072868i
Subject(s) - signature (topology) , layer (electronics) , dielectric , materials science , polymer , layer by layer , nanotechnology , optoelectronics , composite material , geometry , mathematics
Extremely thin films of poly(styrene) (h<or=6 nm), in the geometry of "model" nanocomposites, show a continuous increase of the capacitance with temperature. This phenomenon is discussed in terms of a gradual defreezing of the interfacial zone between the so-called dead layer and the bulk. Such a mechanism shows a strong analogy to the dielectric response of the rigid amorphous fraction in semicrystalline materials. The defreezing process, foregoing the dynamic glass transition, is responsible for the temperature dependence of the deviations from bulk behavior.

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