z-logo
open-access-imgOpen Access
The Chemical Origin of Defects on Silicon Dioxide Exposed to Ethanol
Author(s) -
Che-Chen Chang,
Ming-Chi Shu
Publication year - 2003
Publication title -
the journal of physical chemistry b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.864
H-Index - 392
eISSN - 1520-6106
pISSN - 1520-5207
DOI - 10.1021/jp027372+
Subject(s) - silicon dioxide , ethanol , silicon , chemistry , carbon dioxide , chemical engineering , environmental chemistry , materials science , nanotechnology , organic chemistry , metallurgy , engineering
The adsorption and reaction of ethanol on the metal-free, pure silicon dioxide surface have been studied as a model system to explore the chemical origin of the defects which are detrimental in the gate oxide exposed to chemical vapors. In addition to molecular adsorption, ethanol decomposed to the extent that a variety of species including ethyl, ethoxy, and hydroxyl were produced even at the surface temperature of 115 K. The silicon dioxide surface was selective for the formation of acetaldehyde through cleavage of the C−H bond. The bare surface, however, was more selective for ethanol conversion to ethylene than the surface covered by fragments and products. Comparison of static secondary ion mass spectra taken from the surface exposed to deuterated and nondeuterated ethanol, respectively, showed that the C−H, Et−OH, and EtO−H bonds were disrupted during the surface decomposition of ethanol. Hydroxyl hydrogen of ethanol readily exchanged with silanol hydrogen of the surface. The formation of Si−H and S...

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom