High-Resolution Ion Microscope Imaging over Wide Mass Ranges Using Electrodynamic Postextraction Differential Acceleration | Zendy

Ang Guo | Zendy; Robert J. Burleigh | Zendy; Natasha Smith | Zendy; M. Brouard | Zendy; Michael Burt | Zendy

Open Access

High-Resolution Ion Microscope Imaging over Wide Mass Ranges Using Electrodynamic Postextraction Differential Acceleration

Author(s) -

Ang Guo,

Robert J. Burleigh,

Natasha Smith,

M. Brouard,

Michael Burt

Publication year - 2020

Publication title -

journal of the american society for mass spectrometry

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 0.961

H-Index - 127

eISSN - 1879-1123

pISSN - 1044-0305

DOI - 10.1021/jasms.0c00167

Subject(s) - mass spectrometry , microscope , chemistry , ion , resolution (logic) , acceleration , image resolution , range (aeronautics) , analytical chemistry (journal) , detector , optics , field ion microscope , physics , materials science , chromatography , organic chemistry , classical mechanics , artificial intelligence , computer science , composite material

A time-dependent postextraction differential acceleration (PEDA) potential was used to temporally focus increasingly heavy ions in a stigmatic imaging mass spectrometer, allowing them to be imaged with high mass and spatial resolutions over a broad mass-to-charge ( m / z ) range. By applying a linearly rising potential to the ion extraction electrode, sequential m / z ratios were subjected to a changing electric field, allowing their foci to coincide at the detector. Using this approach, at least 75% of the maximum mass resolution was obtained over a 300-600 Da range when the ion microscope was focused around 450 Da, representing more than a 10-fold increase over the conventional single-field PEDA method.

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