Three-Dimensional Profiling of OLED by Laser Desorption Ionization-Mass Spectrometry Imaging

Organic light emitting devices (OLEDs), especially in a screen display format, present unique and interesting substrates for laser desorption/ionization-mass spectrometry imaging (LDI-MSI) analysis. These devices contain many compounds that inherently absorb light energy and do not require an additional matrix to induce desorption and ionization. OLED screens have lateral features with dimensions that are tens of microns in magnitude and depth features that are tens to hundreds of nanometers thick. Monitoring the chemical composition of these features is essential, as contamination and degradation can impact device lifetime. This work demonstrates the capability of LDI-MSI to obtain lateral and partial depth resolved information on multicolored OLED displays and suggests the application to other mixed organic electronics with minimal sample preparation. This was realized when analyzing two different manufactured OLEDs, in an active-matrix display format, without the need to remove the cathode. By utilizing low laser energy and high lateral spatial resolution imaging (10 μm), depth profiling can be observed while maintaining laterally resolved information, resulting in a three-dimensional MSI approach that would complement existing OLED characterization methods.