Entropic Barriers in Nanoscale Adhesion Studied by Variable Temperature Chemical Force Microscopy [J. Am. Chem. Soc. 2003, 125 (5), 1356−1362].
Author(s) -
Aleksandr Noy,
Salvador Zepeda,
Christine A. Orme,
Yin Yeh,
James J. De Yoreo
Publication year - 2003
Publication title -
journal of the american chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 7.115
H-Index - 612
eISSN - 1520-5126
pISSN - 0002-7863
DOI - 10.1021/ja033443m
Subject(s) - chemistry , nanoscopic scale , adhesion , chemical engineering , atomic force microscopy , nanotechnology , organic chemistry , materials science , engineering
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