Reliability. We come through every day.
Publication year - 1975
Publication title -
chemical and engineering news
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.114
H-Index - 43
eISSN - 1520-605X
pISSN - 0009-2347
DOI - 10.1021/cen-v053n031.p017
Subject(s) - citation , icon , computer science , social media , reliability (semiconductor) , altmetrics , information retrieval , world wide web , power (physics) , physics , quantum mechanics , programming language
Accelerating Research
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