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When Ellipsometry Works Best: A Case Study With Transparent Conductive Oxides
Author(s) -
James Hillier,
S. Camelio,
W. M. Cranton,
Alexei Nabok,
Christopher J. Mellor,
Demosthenes C. Koutsogeorgis,
N. Kalfagiannis
Publication year - 2020
Publication title -
acs photonics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.735
H-Index - 89
ISSN - 2330-4022
DOI - 10.1021/acsphotonics.0c00389
Subject(s) - materials science , plasmon , ellipsometry , ultraviolet , optoelectronics , indium tin oxide , doping , near infrared spectroscopy , transparent conducting film , nanotechnology , thin film , optics , physics

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