Thin Film Analysis by Nanomechanical Infrared Spectroscopy
Author(s) -
Andrea Casci Ceccacci,
Alberto Cagliani,
Paolo Marizza,
Silvan Schmid,
Anja Boisen
Publication year - 2019
Publication title -
acs omega
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.779
H-Index - 40
ISSN - 2470-1343
DOI - 10.1021/acsomega.9b00276
Subject(s) - infrared , materials science , infrared spectroscopy , fourier transform infrared spectroscopy , thin film , characterization (materials science) , spectroscopy , polyvinylpyrrolidone , attenuated total reflection , analytical chemistry (journal) , nanometre , layer (electronics) , optics , optoelectronics , nanotechnology , chemistry , physics , composite material , polymer chemistry , chromatography , organic chemistry , quantum mechanics
There is a fundamental need for techniques for thin film characterization. The current options for obtaining infrared (IR) spectra typically suffer from low signal-to-noise-ratios (SNRs) for sample thicknesses confined to a few nanometers. We present nanomechanical infrared spectroscopy (NAM-IR), which enables the measurement of a complete infrared fingerprint of a polyvinylpyrrolidone (PVP) layer as thin as 20 nm with an SNR of 307. Based on the characterization of the given NAM-IR setup, a minimum film thickness of only 160 pm of PVP can be analyzed with an SNR of 2. Compared to a conventional attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) system, NAM-IR yields an SNR that is 43 times larger for a 20 nm-thick PVP layer and requires only a fraction of the acquisition time. These results pave the way for NAM-IR as a highly sensitive, fast, and practical tool for IR analysis of polymer thin films.
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