Formation Mechanism of Secondary Electron Contrast of Graphene Layers on a Metal Substrate
Author(s) -
Kota Shihommatsu,
Junro Takahashi,
Yuta Momiuchi,
Yudai Hoshi,
Hiroki Kato,
Yoshikazu Homma
Publication year - 2017
Publication title -
acs omega
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.779
H-Index - 40
ISSN - 2470-1343
DOI - 10.1021/acsomega.7b01550
Subject(s) - graphene , scanning electron microscope , materials science , substrate (aquarium) , electron , graphene nanoribbons , monatomic gas , secondary electrons , graphene oxide paper , metal , nanotechnology , chemistry , composite material , physics , metallurgy , geology , oceanography , organic chemistry , quantum mechanics
Scanning electron microscopy (SEM) is widely used to observe graphene on metal substrates. However, the origin of the SEM image contrast of graphene is not well understood. In this work, we performed in situ SEM imaging of layer-number-controlled graphene on a Ni substrate using a high-pass energy filter for secondary electrons. We found that the graphene layer contrast was maximized at 15-20 eV, corresponding to the π-σ* interband transition in graphene. Our results indicate that the SEM image of graphene is produced by attenuation of the electrons emitted from the metal substrate by the monoatomic layers of graphene.
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