Open AccessElectrical Properties of Thin ZrSe3 Films for Device Applications
Author(s) -
Lars Thole,
Christopher Belke,
S. Locmelis,
Peter Behrens,
R. J. Haug
Publication year - 2022
Publication title -
acs omega
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.779
H-Index - 40
ISSN - 2470-1343
DOI - 10.1021/acsomega.2c04198
Subject(s) - materials science , raman spectroscopy , thin film , semiconductor , lithography , chemical vapor deposition , band gap , optoelectronics , transistor , analytical chemistry (journal) , nanotechnology , optics , chemistry , electrical engineering , physics , engineering , chromatography , voltage
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