Trap-Free Heterostructure of PbS Nanoplatelets on InP(001) by Chemical Epitaxy
Author(s) -
Louis Biadala,
Wenbing Peng,
Yannick Lambert,
Jin Hee Kim,
Damien Canneson,
Anthony Houppe,
Maxime Berthe,
David Troadec,
D. Deresmes,
G. Patriarche,
Tao Xu,
Xiaodong Pi,
X. Wallart,
Christophe Delerue,
M. Bayer,
Jimmy Xu,
B. Grandidier
Publication year - 2019
Publication title -
acs nano
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.554
H-Index - 382
eISSN - 1936-086X
pISSN - 1936-0851
DOI - 10.1021/acsnano.8b08413
Subject(s) - heterojunction , epitaxy , materials science , optoelectronics , nanotechnology , trap (plumbing) , chemical beam epitaxy , molecular beam epitaxy , physics , layer (electronics) , meteorology
Semiconductor nanocrystalline heterostructures can be produced by the immersion of semiconductor substrates into an aqueous precursor solution, but this approach usually leads to a high density of interfacial traps. In this work, we study the effect of a chemical passivation of the substrate prior to the nanocrystalline growth. PbS nanoplatelets grown on sulfur-treated InP (001) surfaces at temperatures as low as 95 °C exhibit abrupt crystalline interfaces that allow a direct and reproducible electron transfer to the InP substrate through the nanometer-thick nanoplatelets with scanning tunnelling spectroscopy. It is in sharp contrast with the less defined interface and the hysteresis of the current-voltage characteristics found without the passivation step. Based on a tunnelling effect occurring at energies below the bandgap of PbS, we show the formation of a type II, trap-free, epitaxial heterointerface, with a quality comparable to that grown on a nonreactive InP (110) substrate by molecular beam epitaxy. Our scheme offers an attractive alternative to the fabrication of semiconductor heterostructures in the gas phase.
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