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Sequential Feature-Density Doubling for Ultraviolet Plasmonics
Author(s) -
Michael P. Knudson,
Alexander J. Hryn,
Mark D. Huntington,
Teri W. Odom
Publication year - 2017
Publication title -
acs applied materials and interfaces
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 2.535
H-Index - 228
eISSN - 1944-8252
pISSN - 1944-8244
DOI - 10.1021/acsami.7b10842
Subject(s) - materials science , plasmon , ultraviolet , wavelength , feature (linguistics) , optoelectronics , surface plasmon polariton , silicon , nanostructure , excitation , optics , surface plasmon , ultraviolet light , aluminium , nanotechnology , physics , linguistics , philosophy , quantum mechanics , metallurgy
Patterning of nanostructures with sub-200 nm periodicities over cm 2 -scale areas is challenging using standard approaches. This paper demonstrates a scalable technique for feature-density doubling that can generate nanopatterned lines with periodicities down to 100 nm covering >3 cm 2 . We developed a process based on controlled wet overetching of atomic-layer deposited alumina to tune feature sizes of alumina masks down to several nm. These features transferred into silicon served as masters for template-stripping aluminum nanogratings with three different periodicities. The aluminum nanogratings supported surface plasmon polariton modes at ultraviolet wavelengths that, in agreement with calculations, depended on periodicity and incident excitation angle.

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