Imaging of THz Photonic Modes by Scattering Scanning Near-Field Optical Microscopy
Author(s) -
Louis Thomas,
Théo Hannotte,
Cristiane Nascimento Santos,
Benjamin Walter,
Mélanie Lavancier,
Sophie Eliet,
M. Faucher,
Jean-François Lampin,
Romain Peretti
Publication year - 2022
Publication title -
acs applied materials and interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.535
H-Index - 228
eISSN - 1944-8252
pISSN - 1944-8244
DOI - 10.1021/acsami.2c01871
Subject(s) - terahertz radiation , resonator , materials science , electric field , photonics , optics , near field scanning optical microscope , scattering , microscopy , optical microscope , field (mathematics) , near and far field , optoelectronics , light scattering , nanoscopic scale , physics , nanotechnology , scanning electron microscope , mathematics , quantum mechanics , pure mathematics
We investigated the near-field distribution associated to the photonic mode of terahertz photonic micro-resonators by scattering scanning near-field optical microscopy. Probing individual THz micro-resonators concentrating electric fields is important for high-sensitivity chemical and biochemical sensing and fundamental light-matter interactions studies at the nanoscale. We imaged both electric field concentration predicted by numerical simulations and unexpected patterns that deviate from intuitive assumptions. We propose a scenario based on the combination of the near-field with the far-field pattern of the probe/resonator ensemble that is in excellent agreement with the experimental data and propose an image analysis procedure to recover the near-field of such structures.
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