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Investigation of Plasma Deposited Boron Phosphide and Its Contact to Silicon
Author(s) -
A. A. Maksimova,
A V Uvarov,
A I Baranov,
А.С. Гудовских,
Dmitri A. Kudryashov,
Ekaterina Vyacheslavova,
I. A. Morozov,
Sylvain Le Gall,
JeanPaul Kleider
Publication year - 2022
Publication title -
acs applied energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.833
H-Index - 36
ISSN - 2574-0962
DOI - 10.1021/acsaem.1c02704
Subject(s) - silicon , materials science , substrate (aquarium) , boron , analytical chemistry (journal) , deep level transient spectroscopy , chemical vapor deposition , layer (electronics) , indium phosphide , band gap , fermi level , deposition (geology) , optoelectronics , nanotechnology , chemistry , electron , gallium arsenide , paleontology , oceanography , physics , organic chemistry , chromatography , quantum mechanics , sediment , biology , geology

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