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Efficient Passivation and Low Resistivity for p+-Si/TiO2 Contact by Atomic Layer Deposition
Author(s) -
Naeimeh Mozaffari,
Heping Shen,
Yanting Yin,
Yueliang Li,
Daniel Hiller,
Daniel A. Jacobs,
Hieu T. Nguyen,
Pheng Phang,
Gunther G. Andersson,
Ute Kaiser,
Thomas P. White,
Klaus Weber,
Kylie Catchpole
Publication year - 2020
Publication title -
acs applied energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.833
H-Index - 36
ISSN - 2574-0962
DOI - 10.1021/acsaem.0c00378
Subject(s) - passivation , materials science , silicon , perovskite (structure) , atomic layer deposition , layer (electronics) , tandem , crystalline silicon , optoelectronics , carrier lifetime , electrical resistivity and conductivity , contact resistance , energy conversion efficiency , deposition (geology) , doping , nanotechnology , composite material , chemistry , electrical engineering , crystallography , paleontology , engineering , sediment , biology

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