Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope
Author(s) -
G. NareshKumar,
Jochen Bruckbauer,
Aimo Winkelmann,
Xiang Yu,
B. Hourahine,
P. R. Edwards,
Tao Wang,
C. TragerCowan,
Robert Martin
Publication year - 2019
Publication title -
nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.853
H-Index - 488
eISSN - 1530-6992
pISSN - 1530-6984
DOI - 10.1021/acs.nanolett.9b01054
Subject(s) - cathodoluminescence , electron backscatter diffraction , materials science , nanowire , polarity (international relations) , scanning electron microscope , wurtzite crystal structure , spectroscopy , luminescence , optoelectronics , crystal (programming language) , molecular physics , chemistry , microstructure , physics , computer science , programming language , biochemistry , quantum mechanics , zinc , metallurgy , composite material , cell
The crystal polarity of noncentrosymmetric wurtzite GaN nanowires is determined nondestructively in the scanning electron microscope using electron backscatter diffraction (EBSD). The impact of the nanowire polarity on light emission is then investigated using cathodoluminescence (CL) spectroscopy. EBSD can determine polarity of noncentrosymmetric crystals by interrogating differences in the intensity distribution of bands of the EBSD pattern associated with semipolar planes. Experimental EBSD patterns from an array of GaN nanowires are compared with theoretical patterns produced using dynamical electron simulations to reveal whether they are Ga- or N-polar or, as in several cases, of mixed polarity. CL spectroscopy demonstrates the effect of the polarity on light emission, with spectra obtained from nanowires of known polarity revealing a small but measurable shift (≈28 meV) in the GaN near band edge emission energy between those with Ga and N polarity. We attributed this energy shift to a difference in impurity incorporation in nanowires of different crystal polarity. This approach can be employed to nondestructively identify polarity in a wide range of noncentrosymmetric nanoscale material systems and provide direct comparison with their luminescence.
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