Super-Resolved Traction Force Microscopy (STFM) | Zendy

Huw ColinYork | Zendy; Dilip Shrestha | Zendy; James H. Felce | Zendy; Dominic Waithe | Zendy; Emad Moeendarbary | Zendy; Simon J. Davis | Zendy; Christian Eggeling | Zendy; Marco Fritzsche | Zendy

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Super-Resolved Traction Force Microscopy (STFM)

Author(s) -

Huw ColinYork,

Dilip Shrestha,

James H. Felce,

Dominic Waithe,

Emad Moeendarbary,

Simon J. Davis,

Christian Eggeling,

Marco Fritzsche

Publication year - 2016

Publication title -

nano letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 4.853

H-Index - 488

eISSN - 1530-6992

pISSN - 1530-6984

DOI - 10.1021/acs.nanolett.6b00273

Subject(s) - sted microscopy , microscopy , nanotechnology , materials science , image resolution , optics , physics , laser , stimulated emission

Measuring small forces is a major challenge in cell biology. Here we improve the spatial resolution and accuracy of force reconstruction of the well-established technique of traction force microscopy (TFM) using STED microscopy. The increased spatial resolution of STED-TFM (STFM) allows a greater than 5-fold higher sampling of the forces generated by the cell than conventional TFM, accessing the nano instead of the micron scale. This improvement is highlighted by computer simulations and an activating RBL cell model system.

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