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Measuring Lattice Strain in Three Dimensions through Electron Microscopy
Author(s) -
Bart Goris,
Jan De Beenhouwer,
Annick De Backer,
Daniele Zanaga,
Kees Joost Batenburg,
Ana SánchezIglesias,
Luis M. LizMarzán,
Sandra Van Aert,
Sara Bals,
Jan Sijbers,
Gustaaf Van Tendeloo
Publication year - 2015
Publication title -
nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.853
H-Index - 488
eISSN - 1530-6992
pISSN - 1530-6984
DOI - 10.1021/acs.nanolett.5b03008
Subject(s) - lattice (music) , nanomaterials , materials science , electron tomography , strain (injury) , lattice constant , electron , nanostructure , atomic force microscopy , nanotechnology , condensed matter physics , crystallography , scanning transmission electron microscopy , physics , chemistry , transmission electron microscopy , diffraction , optics , quantum mechanics , medicine , acoustics
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.

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