Formation of SiP2 Nanocrystals Embedded in SiO2 from Phosphorus-Rich SiO1.5 Thin Films | Zendy

S Geiskopf | Zendy; M. Stoffel | Zendy; Xavier Devaux | Zendy; Erwan André | Zendy; Cédric Carteret | Zendy; Alexandre Bouché | Zendy; M. Vergnat | Zendy; H. Rinnert | Zendy

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Formation of SiP₂ Nanocrystals Embedded in SiO₂ from Phosphorus-Rich SiO_1.5 Thin Films

Author(s) -

S Geiskopf,

M. Stoffel,

Xavier Devaux,

Erwan André,

Cédric Carteret,

Alexandre Bouché,

M. Vergnat,

H. Rinnert

Publication year - 2020

Publication title -

the journal of physical chemistry c

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.401

H-Index - 289

eISSN - 1932-7455

pISSN - 1932-7447

DOI - 10.1021/acs.jpcc.9b11416

Subject(s) - materials science , raman spectroscopy , orthorhombic crystal system , spectroscopy , photoluminescence , electron energy loss spectroscopy , analytical chemistry (journal) , thin film , annealing (glass) , transmission electron microscopy , nanocrystal , substrate (aquarium) , density functional theory , crystallography , nanotechnology , optoelectronics , chemistry , crystal structure , computational chemistry , optics , physics , oceanography , chromatography , quantum mechanics , geology , composite material

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