Tuning Mesoporous Silica Film Accessibility Through Controlled Dissolution in NH4F: Investigation of Structural Change by Ellipsometry Porosimetry and X-ray Reflectivity
Author(s) -
Jérôme Loizillon,
Magali Putero,
David Grosso
Publication year - 2019
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.9b09109
Subject(s) - dissolution , porosity , porosimetry , materials science , mesoporous material , chemical engineering , x ray reflectivity , ellipsometry , mineralogy , porous medium , nanotechnology , thin film , composite material , chemistry , catalysis , organic chemistry , engineering
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