Open AccessSelective Probing of Thin-Film Interfaces Using Internal Reflection Sum-Frequency Spectroscopy
Author(s) -
Md. Shafiul Azam,
Canyu Cai,
Dennis K. Hore
Publication year - 2019
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.9b06761
Subject(s) - spectroscopy , materials science , reflection (computer programming) , thin film , total internal reflection , optics , optoelectronics , physics , nanotechnology , computer science , quantum mechanics , programming language
The study of interfacial properties of thin films such as polymers is an important area of surface science. The application of visible–infrared sum-frequency generation spectroscopy to such systems...
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom