Electrochemical Surface Oxidation of Copper Studied by in Situ Grazing Incidence X-ray Diffraction | Zendy

Michael Scherzer | Zendy; Frank Girgsdies | Zendy; Eugen Stotz | Zendy; MarcGeorg Willinger | Zendy; Elias Frei | Zendy; Robert Schlögl | Zendy; U. Pietsch | Zendy; Thomas Lunkenbein | Zendy

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Electrochemical Surface Oxidation of Copper Studied by in Situ Grazing Incidence X-ray Diffraction

Author(s) -

Michael Scherzer,

Frank Girgsdies,

Eugen Stotz,

MarcGeorg Willinger,

Elias Frei,

Robert Schlögl,

U. Pietsch,

Thomas Lunkenbein

Publication year - 2019

Publication title -

the journal of physical chemistry c

Language(s) - English

Resource type - Journals

eISSN - 1932-7455

pISSN - 1932-7447

DOI - 10.1021/acs.jpcc.9b00282

Subject(s) - cuprite , in situ , materials science , electrochemistry , copper , crystallite , diffraction , x ray crystallography , analytical chemistry (journal) , metal , crystallography , electrode , metallurgy , chemistry , optics , physics , organic chemistry , chromatography

Grazing incidence X-ray diffractometry (GIXRD) can deliver integral information on the structure and chemistry of surface near regions, which can be beneficial for functional materials related to i...

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