Depth Profiling of the Chemical Composition of Free-Standing Carbon Dots Using X-ray Photoelectron Spectroscopy
Author(s) -
Irène Papagiannouli,
Minna Patanen,
Valérie Blanchet,
John D. Bozek,
Manuel De Anda Villa,
Marko Huttula,
Esko Kokkonen,
E. Lamour,
E. Mével,
Eetu Pelimanni,
Antoine Scalabre,
M. Trassinelli,
Dario M. Bassani,
A. Lévy,
J. Gaudin
Publication year - 2018
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.8b03800
Subject(s) - x ray photoelectron spectroscopy , high resolution transmission electron microscopy , analytical chemistry (journal) , materials science , chemical composition , synchrotron , chemistry , transmission electron microscopy , nanotechnology , optics , physics , nuclear magnetic resonance , organic chemistry , chromatography
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