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Formation of Multilayer Cu Islands Embedded beneath the Surface of Graphite: Characterization and Fundamental Insights
Author(s) -
Ann Lii-Rosales,
Yong Han,
James W. Evans,
Dapeng Jing,
Yinghui Zhou,
Michael C. Tringides,
Minsung Kim,
CaiZhuang Wang,
P. A. Thiel
Publication year - 2018
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.7b12533
Subject(s) - overlayer , graphite , scanning tunneling microscope , x ray photoelectron spectroscopy , materials science , deposition (geology) , island growth , adsorption , atom (system on chip) , layer (electronics) , chemical physics , analytical chemistry (journal) , nanotechnology , chemical engineering , chemistry , composite material , epitaxy , geology , paleontology , chromatography , sediment , computer science , engineering , embedded system
We present an extensive experimental study of the conditions under which Cu forms encapsulated islands under the top surface layers of graphite, as a result of physical vapor deposition of Cu on argon-ion-bombarded graphite. When the substrate is held at 800 K during deposition, conditions are optimal for formation of encapsulated multilayer Cu islands. Deposition temperatures below 600 K favor adsorbed Cu clusters, while deposition temperatures above 800 K favor a different type of feature that is probably a single-layer intercalated Cu island. The multilayer Cu islands are characterized with respect to size and shape, thickness and continuity of the graphitic overlayer, relationship to graphite steps, and stability in air. The experimental techniques are scanning tunneling microscopy and X-ray photoelectron spectroscopy. We also present an extensive study using density functional theory to compare stabilities of a wide variety of configurations of Cu atoms, Cu clusters, and Cu layers on/under the graphi...

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