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Understanding Chemical versus Electrostatic Shifts in X-ray Photoelectron Spectra of Organic Self-Assembled Monolayers
Author(s) -
T. Taucher,
Iris Hehn,
Oliver Hofmann,
Michael Zharnikov,
Egbert Zojer
Publication year - 2016
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.5b12387
Subject(s) - x ray photoelectron spectroscopy , monolayer , binding energy , chemical physics , density functional theory , polar , spectral line , chemical shift , electrostatics , self assembled monolayer , chemistry , nanoscopic scale , dipole , superposition principle , materials science , computational chemistry , nanotechnology , atomic physics , nuclear magnetic resonance , organic chemistry , physics , astronomy , quantum mechanics
The focus of the present article is on understanding the insight that X-ray photoelectron spectroscopy (XPS) measurements can provide when studying self-assembled monolayers. Comparing density functional theory calculations to experimental data on deliberately chosen model systems, we show that both the chemical environment and electrostatic effects arising from a superposition of molecular dipoles influence the measured core-level binding energies to a significant degree. The crucial role of the often overlooked electrostatic effects in polar self-assembled monolayers (SAMs) is unambiguously demonstrated by changing the dipole density through varying the SAM coverage. As a consequence of this effect, care has to be taken when extracting chemical information from the XP spectra of ordered organic adsorbate layers. Our results, furthermore, imply that XPS is a powerful tool for probing local variations in the electrostatic energy in nanoscopic systems, especially in SAMs.

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