Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors | Zendy

Onovbaramwen Jennifer Usiobo | Zendy; Hiroyuki Kanda | Zendy; Paul Gratia | Zendy; Iwan Zimmermann | Zendy; Tom Wirtz | Zendy; Mohammad Khaja Nazeeruddin | Zendy; JeanNicolas Audinot | Zendy

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Nanoscale Mass-Spectrometry Imaging of Grain Boundaries in Perovskite Semiconductors

Author(s) -

Onovbaramwen Jennifer Usiobo,

Hiroyuki Kanda,

Paul Gratia,

Iwan Zimmermann,

Tom Wirtz,

Mohammad Khaja Nazeeruddin,

JeanNicolas Audinot

Publication year - 2020

Publication title -

the journal of physical chemistry c

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.401

H-Index - 289

eISSN - 1932-7455

pISSN - 1932-7447

DOI - 10.1021/acs.jpcc.0c07464

Subject(s) - nanometre , characterization (materials science) , alkali metal , nanoscopic scale , secondary ion mass spectrometry , perovskite (structure) , halide , grain boundary , mass spectrometry , materials science , analytical chemistry (journal) , semiconductor , nanotechnology , chemistry , inorganic chemistry , optoelectronics , microstructure , crystallography , metallurgy , environmental chemistry , chromatography , organic chemistry , composite material

Incorporation of alkali metals such as Cs+, Rb+ and K+ into hybrid organic-inorganic halide lead perovskites (HOIPs) generally improves the optoelectronic properties of HOIPs. However, it is still ...

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