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Area-Selective Atomic Layer Deposition of In2O3:H Using a μ-Plasma Printer for Local Area Activation
Author(s) -
Alfredo Mameli,
Yinghuan Kuang,
Morteza Aghaee,
Chaitanya Krishna Ande,
Bora Karasulu,
Mariadriana Creatore,
Adriaan J. M. Mackus,
W. M. M. Kessels,
F. Roozeboom
Publication year - 2017
Publication title -
chemistry of materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.741
H-Index - 375
eISSN - 1520-5002
pISSN - 0897-4756
DOI - 10.1021/acs.chemmater.6b04469
Subject(s) - atomic layer deposition , citation , library science , computer science , nanotechnology , layer (electronics) , physics , materials science
Researchers present a novel method for area-selective atomic layer deposition (AS-ALD) large-area electronics. It is a direct-write ALD process of In2O3:H, a highly promising and relevant transparent conductive oxide (TCO) material which makes use of printing technology for surface activation. first the surface of H-terminated silicon materials is locally activated by a μ-plasma printer in air or O2, and In2O3:H is deposited selectively on the activated areas. The selectivity stems from the fact that ALD In2O3:H leads to very long nucleation delays on H-terminated silicon materials.

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