Impact of Paracetamol Impurities on Face Properties: Investigating the Surface of Single Crystals Using TOF-SIMS
Author(s) -
Sara Ottoboni,
Michael Chrubasik,
Layla Mir Bruce,
Thai Thu Hien Nguyen,
Murray N. Robertson,
Blair F. Johnston,
Iain D. H. Oswald,
Alastair J. Florence,
C. Price
Publication year - 2018
Publication title -
crystal growth and design
Language(s) - English
Resource type - Journals
eISSN - 1528-7505
pISSN - 1528-7483
DOI - 10.1021/acs.cgd.7b01411
Subject(s) - impurity , crystallization , raman spectroscopy , secondary ion mass spectrometry , x ray photoelectron spectroscopy , analytical chemistry (journal) , chemistry , crystal (programming language) , scanning electron microscope , characterization (materials science) , mass spectrometry , materials science , crystallography , nanotechnology , chemical engineering , chromatography , optics , organic chemistry , physics , computer science , composite material , programming language , engineering
Understanding the mechanism of interaction between pharmaceutical molecules (APIs) and impurities on crystal surfaces is a key concept in understanding purification and for the design of pharmaceutical crystallization processes. Several techniques may be used to study crystal surface properties, such as scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS), which provide detailed imaging and elemental surface characterization. Time of flight secondary ion mass spectrometry (TOF-SIMS) is valuable in determining molecular identity and distribution. By combining TOF-SIMS, SEM, and optical (OM) and Raman microscopies, we can evaluate the usefulness of TOF-SIMS as a surface characterization technique for pharmaceutical crystals. 4-Nitrophenol has been selected as an impurity that can be incorporated during crystallization of acetaminophen (paracetamol). This study explores the distribution of impurity and its concentration on the different crystal faces of samples obtained by crystalliz...
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