Structural Properties of TaAs Weyl Semimetal Thin Films Grown by Molecular Beam Epitaxy on GaAs(001) Substrates
Author(s) -
J. Sadowski,
J. Z. Domagała,
Wiktoria Zajkowska,
S. Kret,
Bartłomiej Seredyński,
Marta Gryglas-Borysiewicz,
Zuzanna Ogorzałek,
R. Bożek,
W. Pacuski
Publication year - 2022
Publication title -
crystal growth and design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.966
H-Index - 155
eISSN - 1528-7505
pISSN - 1528-7483
DOI - 10.1021/acs.cgd.2c00669
Subject(s) - molecular beam epitaxy , electron diffraction , transmission electron microscopy , tetragonal crystal system , crystallography , thin film , materials science , stacking , reflection high energy electron diffraction , epitaxy , diffraction , semimetal , stacking fault , condensed matter physics , layer (electronics) , chemistry , crystal structure , optoelectronics , optics , dislocation , silicon , nanotechnology , physics , organic chemistry
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