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Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC
Author(s) -
Cristiano Calabretta,
Viviana Scuderi,
Corrado Bongiorno,
Annalisa Cannizzaro,
Ruggero Anzalone,
L. Calcagno,
Marco Mauceri,
Danilo Crippa,
Simona Boninelli,
Francesco La Via
Publication year - 2022
Publication title -
crystal growth and design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.966
H-Index - 155
eISSN - 1528-7505
pISSN - 1528-7483
DOI - 10.1021/acs.cgd.2c00515
Subject(s) - materials science , nitrogen , silicon carbide , stacking fault , diamond , microelectronics , stacking , doping , chemical vapor deposition , transmission electron microscopy , silicon , high resolution transmission electron microscopy , scanning electron microscope , crystallography , analytical chemistry (journal) , composite material , nanotechnology , optoelectronics , dislocation , chemistry , organic chemistry , chromatography

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