Open AccessDiffraction Line Profiles in the Rietveld Method
Author(s) -
Paolo Scardi
Publication year - 2020
Publication title -
crystal growth and design
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.966
H-Index - 155
eISSN - 1528-7505
pISSN - 1528-7483
DOI - 10.1021/acs.cgd.0c00956
Subject(s) - diffraction , line (geometry) , rietveld refinement , convolution (computer science) , schematic , gaussian , powder diffraction , optics , computer science , physics , mathematics , geometry , crystallography , chemistry , electronic engineering , artificial intelligence , engineering , quantum mechanics , artificial neural network
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