Open AccessCorrection to Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-of-Flight Techniques
Author(s) -
Hyun S. Ahn,
Allen J. Bard
Publication year - 2015
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/acs.analchem.5b04792
Subject(s) - chemistry , interrogation , transient (computer programming) , scanning electrochemical microscopy , time of flight , nanotechnology , analytical chemistry (journal) , electrochemistry , optoelectronics , electrode , chromatography , archaeology , computer science , history , materials science , physics , operating system
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