Open AccessMagnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging
Author(s) -
Olivier De Castro,
JeanNicolas Audinot,
Hung Quang Hoang,
Chérif Coulbary,
Olivier Bouton,
Rachid Barrahma,
Alexander Øst,
Charlotte Stoffels,
Chengge Jiao,
Mikhail Dutka,
Michal Geryk,
Tom Wirtz
Publication year - 2022
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/acs.analchem.2c01410
Subject(s) - chemistry , nanoscopic scale , secondary ion mass spectrometry , chemical imaging , mass spectrometry , mass spectrometry imaging , ion , analytical chemistry (journal) , nanotechnology , environmental chemistry , chromatography , remote sensing , materials science , organic chemistry , geology , hyperspectral imaging
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom