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Application of a Cryo-FIB-SEM-μRaman Instrument to Probe the Depth of Vitreous Ice in a Frozen Sample
Author(s) -
Mouad Essani,
JeanYves Mevellec,
Baptiste Charbonnier,
Philippe Moreau,
Hilel Moussi,
Pierre Weiss,
Jean Le Bideau,
Maxime Bayle,
Bernard Humbert,
Patricia Abellán
Publication year - 2022
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/acs.analchem.2c00245
Subject(s) - raman spectroscopy , focused ion beam , scanning electron microscope , raman microscope , sample preparation , chemistry , characterization (materials science) , environmental scanning electron microscope , amorphous ice , microscope , nanotechnology , materials science , optics , composite material , ion , raman scattering , chromatography , amorphous solid , crystallography , physics , organic chemistry

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