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Revealing Electrical Double-Layer Potential of Substrates by Hysteresis Ion Transport in Scanning Ion Conductance Microscopy
Author(s) -
Yingfei Ma,
Dengchao Wang
Publication year - 2021
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/acs.analchem.1c04486
Subject(s) - chemistry , ion , hysteresis , conductance , nanoscopic scale , nanotechnology , chemical physics , ion transporter , double layer (biology) , microscopy , layer (electronics) , analytical chemistry (journal) , chromatography , condensed matter physics , materials science , optics , physics , organic chemistry
The electrical double layer (EDL) at solid-liquid interfaces is key to interfacial transport and reaction processes and numerous emerging applications exploiting such processes. Herein, by studying hysteresis ion-transport processes in nanopipettes near charged substrates, we found the resulting cross-point potential ( V cp ) to represent the surface potential of both nanopipettes and substrates. After the subtraction of V cp in bulk solution, the remaining Δ V cp shows excellent exponential decay with respect to the separation distance from the substrates and agrees very well with the classical double-layer theory. The revealed new hysteresis ion transport in nanopipettes would provide a new way for the simple and direct EDL imaging of various interfaces of interest with nanoscale resolution in scanning ion conductance microscopy.

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