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Low-Dose Electron Microscopy Imaging of Electron Beam-Sensitive Crystalline Materials
Author(s) -
Jia Lv,
Hui Zhang,
Daliang Zhang,
Lingmei Liu,
Yu Han
Publication year - 2022
Publication title -
accounts of materials research
Language(s) - Uncategorized
Resource type - Journals
ISSN - 2643-6728
DOI - 10.1021/accountsmr.2c00008
Subject(s) - electron microscope , electron , materials science , cathode ray , electron tomography , microscopy , electron beam induced deposition , optics , scanning transmission electron microscopy , physics , nuclear physics

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