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Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precursors for the Bottom-Up Approach of Nanoscaled Devices
Author(s) -
Markus Holzweber,
Thomas Heinrich,
Valentin Kunz,
Sebastián Richter,
Christoph H.-H. Traulsen,
Christoph A. Schalley,
Wolfgang E. S. Unger
Publication year - 2014
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/ac500059a
Subject(s) - chemistry , principal component analysis , monolayer , self assembly , mass spectrometry , layer (electronics) , secondary ion mass spectrometry , time of flight , self assembled monolayer , component (thermodynamics) , analytical chemistry (journal) , nanotechnology , chromatography , organic chemistry , materials science , biochemistry , physics , artificial intelligence , computer science , thermodynamics
The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis (PCA) was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the LbL self-assembly of macrocycles and the corresponding stepwise surface modification.

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