z-logo
open-access-imgOpen Access
Ion microprobe mass spectrometry using sputtering atomization and resonance ionization
Author(s) -
D. L. Donohue,
W. H. Christie,
D. E. Goeringe,
H. S. McKown
Publication year - 1985
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/ac00284a007
Subject(s) - chemistry , microprobe , mass spectrometry , ion , sputtering , ionization , fast atom bombardment , analytical chemistry (journal) , thermal ionization mass spectrometry , chromatography , nanotechnology , thin film , mineralogy , materials science , organic chemistry

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom