Ion microprobe mass spectrometry using sputtering atomization and resonance ionization
Author(s) -
D. L. Donohue,
W. H. Christie,
D. E. Goeringe,
H. S. McKown
Publication year - 1985
Publication title -
analytical chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.117
H-Index - 332
eISSN - 1520-6882
pISSN - 0003-2700
DOI - 10.1021/ac00284a007
Subject(s) - chemistry , microprobe , mass spectrometry , ion , sputtering , ionization , fast atom bombardment , analytical chemistry (journal) , thermal ionization mass spectrometry , chromatography , nanotechnology , thin film , mineralogy , materials science , organic chemistry
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom