rheed++: A C++ framework to simulation of RHEED intensity oscillations during the growth of thin epitaxial films | Zendy

Andrzej Daniluk | Zendy

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rheed++: A C++ framework to simulation of RHEED intensity oscillations during the growth of thin epitaxial films

Author(s) -

Andrzej Daniluk

Publication year - 2020

Publication title -

softwarex

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.528

H-Index - 21

ISSN - 2352-7110

DOI - 10.1016/j.softx.2020.100593

Subject(s) - reflection high energy electron diffraction , specular reflection , oscillation (cell signaling) , epitaxy , scattering , intensity (physics) , optics , thin film , physics , computational physics , materials science , condensed matter physics , layer (electronics) , chemistry , nanotechnology , biochemistry

A time-efficient, compact and flexible computer model has been developed for calculations of RHEED intensity oscillations during the growth of thin epitaxial films. The main functionality of the model is its ability to perform dynamical calculations of amplitude of the RHEED specular beam intensity oscillations as a function of growth time using the scattering potential for heteroepitaxial structures, accounting for the possible occurrence of diffuse scattering through the layer parallel to the surface. The existence of a large number of user-definable parameters make the presented model highly versatile. To validate the model, a calculated plot of the RHEED oscillation has been compared with experimental data taken from the literature. The model does not require linking to any of the existing numerical library routines.

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