X-Ray Calc: A software for the simulation of X-ray reflectivity | Zendy

Oleksiy V. Penkov | Zendy; I. А. Kopylets | Zendy; Mahdi Khadem | Zendy; Tianzuo Qin | Zendy

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X-Ray Calc: A software for the simulation of X-ray reflectivity

Author(s) -

Oleksiy V. Penkov,

I. А. Kopylets,

Mahdi Khadem,

Tianzuo Qin

Publication year - 2020

Publication title -

softwarex

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.528

H-Index - 21

ISSN - 2352-7110

DOI - 10.1016/j.softx.2020.100528

Subject(s) - x ray reflectivity , reflectometry , computer science , software , optics , ray tracing (physics) , x ray optics , surface finish , x ray , computational science , computation , materials science , computer graphics (images) , reflectivity , physics , algorithm , time domain , composite material , computer vision , programming language

X-Ray Calc is a fast and convenient tool for the simulation of X-ray reflectivity (XRR). The software was developed with the aim of simplification and acceleration of the XRR simulation through a user-friendly interface and optimized computation core. X-Ray Calc implements the recursive approach of calculation of XRR based on Fresnel equations and proposes special instruments for the modeling of periodical multilayer structures. X-Ray Calc computes XRR as a function of wavelength or grazing angle and can be used for the simulation of the performance of X-ray mirrors. Computer modeling and fitting to experimental grazing incidence X-ray reflectometry (GIXR) is a powerful tool. It could be used for a comprehensive analysis of the structure of single- and multi-component layered nanomaterials. This method allows for the obtaining of information about thickness, roughness, and density of individual layers in coatings by the fitting of the modeled GIXR to the experimental ones.

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