TRIZ-based Systematic Device Trimming: Theory and Application
Author(s) -
D. Daniel Sheu,
Chun Ting Hou
Publication year - 2015
Publication title -
procedia engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.32
H-Index - 74
ISSN - 1877-7058
DOI - 10.1016/j.proeng.2015.12.385
Subject(s) - trimming , triz , troubleshooting , process (computing) , key (lock) , component (thermodynamics) , computer science , reduction (mathematics) , engineering , reliability engineering , mechanical engineering , artificial intelligence , mathematics , physics , geometry , computer security , thermodynamics , operating system
This paper proposed a TRIZ-based systematic Device Trimming Algorithm with theory and application. The method can be used to resolve process-machine problems by re-designing the problematic processing machines or simply used to trim components for various purposes. The trimming process is orchestrated by a trimming plan which consists of sequenced trimming tasks. Elements of each trimming task include function carrier, useful functions, objects, trimming rules, new carriers, trimming problem statement, and trimming method. A 2-loop depth-first recursive trimming process is proposed to maximize the trimming effect. Applied on a slit-valve failure of a chemical vapor deposition equipment in one of major Taiwanese foundry companies, the proposed problem solving process successfully identified the critical key disadvantages of the problem and solved the slit-valve failure with breakthrough results. A number of solutions were generated by the integrated process which involves a number of TRIZ tools. This paper describes only the solution by the trimming process. The main contributions of this paper include:1) Establishing an integrated trimming process consistent with TRIZ problem-solving model and capable of breakthrough problem solving and cost savings; 2) Solving the slit-valve problem with 83.3% component count reduction, 95% component cost reduction, 99% operational energy reduction, and completely designed-out the original failure mode. The results have been converted into a patent pending approval
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