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Vapour HF Release of Airgap-based UV-visible Optical Filters
Author(s) -
M. Ghaderi,
N. Pelin Ayerden,
G. de Graaf,
R.F. Wolffenbuttel
Publication year - 2015
Publication title -
procedia engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.32
H-Index - 74
ISSN - 1877-7058
DOI - 10.1016/j.proeng.2015.08.674
Subject(s) - materials science , fabrication , dielectric , optical filter , refractive index , surface micromachining , optoelectronics , etching (microfabrication) , stiction , distributed bragg reflector , stack (abstract data type) , optics , filter (signal processing) , layer (electronics) , electronic engineering , microelectromechanical systems , composite material , engineering , electrical engineering , computer science , medicine , wavelength , alternative medicine , physics , pathology , programming language
The design and CMOS-compatible fabrication of airgap-based optical filters in a surface micromachining process with sacrificial release using thevapour phase is presented. An airgap-dielectric layer combination offers a higher refractive index contrast, as compared to the conventional all-dielectriclayer based filters, which results in a higher peak reflectance and a wider bandwidth in a distributed Bragg reflector (DBR). Several DBRs and Fabry-Perot filters with multiple (low-n) airgap layers separating a stack of (high-n) layers of a dielectric material were designed for operation in the UV-visible spectrum. The fabrication was based on an Al2O3 and SiO2 system. The lateral design includes a set of anchor points and access holes. Finally, a vapour phase HF etching was used to remove the SiO2 layers and release the Al2O3 membranes. This method prevents the stiction of the membranes and provides a higher control and uniformity over the filter area.MicroelectronicsElectrical Engineering, Mathematics and Computer Scienc

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