Analytical Model and Practicle Validation of Phase Variation of Reflect Array Antenna
Author(s) -
M. Inam,
M. Y. Ismail
Publication year - 2013
Publication title -
procedia engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.32
H-Index - 74
ISSN - 1877-7058
DOI - 10.1016/j.proeng.2013.02.030
Subject(s) - optics , phased array , antenna array , figure of merit , bandwidth (computing) , planar array , planar , scattering parameters , materials science , dielectric , phase (matter) , x band , frequency band , reflection (computer programming) , microstrip antenna , scattering , antenna (radio) , acoustics , physics , optoelectronics , computer science , telecommunications , computer graphics (images) , quantum mechanics , programming language
Reflection phase properties of reflect array antenna design in the X-band frequency range has been addressed in this work. An analyticalmodel for obtaining the required reflection phase from individual reflect array elements to form a planar wave in front of the periodicaperture has been presented. A unit cell patch element representing an infinite reflect array modeled based on FEM using the waveguidesimulator demonstrated that there is no significant influence on the scattering parameters of reflect array resonant elements until the angleof incidence is increased up to 40 degrees. A Figure of Merit (FoM) has been defined for the comparison of the reflection phase curves ofreflect arrays modeled with different dielectric substrates and the results are compared in terms of bandwidth performance and staticlinear phase range. Furthermore reflect array unit cell patch elements have been fabricated in X-band frequency range using differenthe practical validation of thewaveguide scattering parameter measurements of unit cell reflect array elements. The measured results demonstrated an improvement inFoM and reflect array bandwidth performance with an increase in substrate thickness
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