Defect Classification of Electronic Board Using Dense SIFT and CNN

This paper proposes a new defect classification method of electronic board using Dense SIFT and CNN which can represent the effective features to the gray scale image. Proposed method does not use any reference image and effective keypoints are detected using Dense SIFT on the defect candidate region. Removing the feature points except defect region and Bag of Features are used to represent the histogram features. Dense SIFT and SVM are used to judge defect or not. CNN is further introduced to classify true or pseudo defect. Classification accuracy was evaluated and effectiveness of the proposed method is shown.