Embedded Transient Shock Signal Storage Test Technique under High Overload

To avoid the interference causing by testing cables of acceleration sensors and acquire the dynamic impact load acceleration data conveniently and reliably in the environmental test as the penetrating or drop test, the embedded transient shock signal measurement system is designed adopting the storage measurement technique integrating the accelerometer, signal conditioning circuits, data sampling and storage circuit, communication interface circuit, and a power source. It is of small size, low power consumption, capable of working under high impact acceleration and good engineering practicability validated by a drop test. Based on fully integrated mixed-signal system-on-chip MCU C8051F340 with full speed USB flash, the system has 100 KHz sampling frequency, 5 second sampling length, 1g measuring range, which can resist at least high overload of 60000g through the static and dynamic calibration device. In this paper, the operation principle, the circuits of central modules, the Labview software design interface, the static and dynamic encapsulating technology and calibration method are simply introduced. The design has some referenced value for me