Use of Laser Beam Diffraction for Non-invasive Characterisation of CdTe Thin Film Growth Structure
Author(s) -
Nicholas Goffin,
Fabiana Lisco,
Alessandro Simeone,
Gianfranco Claudio,
John Tyrer,
Elliot Woolley
Publication year - 2015
Publication title -
procedia cirp
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.683
H-Index - 65
ISSN - 2212-8271
DOI - 10.1016/j.procir.2015.08.077
Subject(s) - cadmium telluride photovoltaics , materials science , sublimation (psychology) , thin film , optoelectronics , sputter deposition , optics , diffraction , laser , sputtering , nanotechnology , psychology , physics , psychotherapist
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