z-logo
open-access-imgOpen Access
Machine-learning-enhanced time-of-flight mass spectrometry analysis
Author(s) -
Ye Wei,
Rama Srinivas Varanasi,
Torsten Schwarz,
Leonie Gomell,
Huan Zhao,
David J. Larson,
Binhan Sun,
Geng Liu,
Hao Chen,
Dierk Raabe,
Baptiste Gault
Publication year - 2021
Publication title -
patterns
Language(s) - English
Resource type - Journals
ISSN - 2666-3899
DOI - 10.1016/j.patter.2020.100192
Subject(s) - mass spectrometry , mass spectrum , time of flight mass spectrometry , time of flight , computer science , standardization , analytical chemistry (journal) , artificial intelligence , chemistry , chromatography , ion , organic chemistry , ionization , operating system
Summary Mass spectrometry is a widespread approach used to work out what the constituents of a material are. Atoms and molecules are removed from the material and collected, and subsequently, a critical step is to infer their correct identities based on patterns formed in their mass-to-charge ratios and relative isotopic abundances. However, this identification step still mainly relies on individual users' expertise, making its standardization challenging, and hindering efficient data processing. Here, we introduce an approach that leverages modern machine learning technique to identify peak patterns in time-of-flight mass spectra within microseconds, outperforming human users without loss of accuracy. Our approach is cross-validated on mass spectra generated from different time-of-flight mass spectrometry (ToF-MS) techniques, offering the ToF-MS community an open-source, intelligent mass spectra analysis.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom