Novel methods for dislocation density estimation in highly compacted tangles
Author(s) -
Sérgio Neves Monteiro,
Luiz Paulo Mendonça Brandão,
Talita Gama de Sousa,
Fábio da Costa Garcia Filho
Publication year - 2019
Publication title -
journal of materials research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.832
H-Index - 44
eISSN - 2214-0697
pISSN - 2238-7854
DOI - 10.1016/j.jmrt.2019.12.040
Subject(s) - dislocation , materials science , substructure , transmission electron microscopy , foil method , peierls stress , tangle , deformation (meteorology) , crystallography , dislocation creep , condensed matter physics , composite material , nanotechnology , structural engineering , physics , mathematics , chemistry , pure mathematics , engineering
Dislocation lines are usually observed in thin foil images obtained by transmission electron microscopy (TEM). Based on conventional methods involving stereological relationship and line counting, dislocation densities have been calculated in distinct materials, mostly in plastically deformed metals and alloys. However, under certain plastic deformation conditions, such as those associated with dynamic strain aging (DSA), dislocation arrangements may develop highly compact tangles. Inside DSA dense tangles, the individual identification of lines for stereological counting becomes impracticable. In the present work, two novel methods to estimate dislocation densities in highly compact tangles are proposed. The first method is exemplified in TEM images of cells and banded walls substructure of an austenitic stainless steel plastically deformed under DSA condition. In a second method, the average dislocation density of such TEM images is proposed to be calculated by the proportional sum of area fractions multiplied by corresponding dislocation densities of visible dislocation and highly compact tangle areas as well as dislocation-free area.
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