Open AccessHigh amplitude short time excitation: A method to form and detect low mass product ions in a quadrupole ion trap mass spectrometer
Author(s) -
Connell Cunningham,
Gary L. Glish,
David J. Burinsky
Publication year - 2006
Publication title -
journal of the american society for mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.961
H-Index - 127
eISSN - 1879-1123
pISSN - 1044-0305
DOI - 10.1016/j.jasms.2005.09.007
Subject(s) - chemistry , quadrupole ion trap , ion trap , ion , mass spectrometry , dissociation (chemistry) , collision induced dissociation , analytical chemistry (journal) , ion trapping , excitation , hybrid mass spectrometer , mass spectrum , quadrupole , atomic physics , selected reaction monitoring , tandem mass spectrometry , chromatography , physics , organic chemistry , quantum mechanics
Collision induced dissociation (CID) in a quadrupole ion trap mass spectrometer using the conventional 30 ms activation time is compared with high amplitude short time excitation (HASTE) CID using 2 ms and 1 ms activation times. As a result of the shorter activation times, dissociation of the parent ions using the HASTE CID technique requires resonance excitation voltages greater than conventional CID. After activation, the rf trapping voltage is lowered to allow product ions below the low mass cut-off to be trapped. The HASTE CID spectra are notably different from those obtained using conventional CID and can include product ions below the low mass cut-off for the parent ions of interest. The MS/MS efficiencies of HASTE CID are not significantly different when compared with the conventional 30 ms CID. Similar results were obtained with a two-dimensional (linear) ion trap and a three-dimensional ion trap.